SWIR Microscopy
Discover the Unseen with SWIR Microscopy.
SWIR microscopy extend your capabilities far beyond those of standard optical microscopes. Equipped with specialized optics, light sources, and cameras, they can image samples in both the visible and shortwave infrared (SWIR) regions. This advanced imaging technology offers distinct advantages over conventional microscopes:
- Material Transparency: Some materials opaque in the visible spectrum become transparent in the SWIR range.
- Enhanced Contrast: Certain materials exhibit greater contrast in the SWIR region.
For instance, silicon, which is opaque under normal light, becomes transparent in the SWIR region, allowing for the inspection of silicon-based device interiors without disassembly.
CRAIC Technologies provides tailored solutions for SWIR microscopy. These custom-designed microscopes can image across the visible to shortwave infrared spectrum and perform microscopy in transmission, reflectance, and fluorescence. Unlock new possibilities with SWIR microscopy.
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