UV-visible-NIR, Fluorescence, Photoluminescence & Raman Microspectrophotometers
CRAIC Technologies™ designs, builds and supports microspectrometers that collect spectra and images of microscopic samples from the deep UV to the NIR.
CRAIC Technologies™ designs, builds and supports microspectrometers that collect spectra and images of microscopic samples from the deep UV to the NIR.
UV-vis-NIR Microspectrometers
Photoluminescence Microspectrometers
Raman Microspectrometers
UV & NIR Microscopes
Petrography
Glass Refractive Index Measurement
Thin Film Thickness
More Innovations
Applications
Services
UV-Visible-NIR Microspectrophotometer: an instrument designed to measure the UV-visible-NIR spectra of microscopic samples by transmittance, reflectance, polarization, fluorescence, and other types of luminescence. With specialized software, they can be used to measure thin film thickness, colorimetry and more. The following links have more information:
- What is a Microspectrophotometer?
- Science of Microspectroscopy
- How Microspectrophotometers are Used
- Thin Film Thickness Measurement of Microscopic areas
- 2030PV PRO™ UV-Visible-NIR Microspectrophotometer
- 2030XL PRO™: Microspot Measurements on Very Large Samples
- FLEX PRO™ UV-Visible Microspectrophotometer
- 508PV™ Microscope Spectrometer
Photoluminescence Microspectrometer: an instrument designed to measure the fluorescence, photoluminescence, and emission spectra of microscopic samples with excitation in the UV, visible and NIR regions. The following links have more information:
Raman Microspectrometer: an instrument designed to measure the Raman spectra of microscopic samples. The following links contain more information about CRAIC Technologies Raman microspectrometer solutions:
UV-Vis-NIR Microscope: CRAIC Technologies UV-Vis-NIR microscope systems allow the user to image items that cannot be seen with commonly available microscopes that only cover the visible range. This capability is useful in diverse fields such as a protein crystal analysis for drug discovery to contamination control for semiconductors to interior circuits in bonded silicon devices. The following links contain more information:
Vitrinite reflectance, point counting and fluorescence of coal, coke and petroleum source rock with
- GeoImager™ Imaging Photometer for your microscope
- CoalPro™ vitrinite reflectance software for your microspectrometer
Thin Film Thickness Measurement: Advanced microspot thin film thickness measurement featuring film thickness mapping of greater than 300 mm wafers
Universal C-Mount
Laser Illumination
UV-Visible-NIR Polarization
Spectroscopy Standards
Thin Film Thickness Measurement
Instrument Automation
Automation Packages: Automate microspectral and image analysis, including 3D mapping, with the addition of CRAIC Technologies automation solutions. Ideal for industrial applications that require repetitive measurements.
CRAIC Technologies provides service and support for it's instruments worldwide. CRAIC Technologies service engineers and scientists offer instrument repair, maintenance, training and technical support for all aspects of CRAIC Technologies products.